UV-Visible-NIR Spectrophotometers | UH4150

Hitachi UH4150 UV-Visible-NIR Spectrophotometer

Advanced Solid-Phase Spectrophotometry: The ideal system for measuring optical materials and large samples.

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Overview

The successor to the reliability-proven U-4100, the new UH4150 is the latest high performance UV-Visible-NIR Spectrophotometer from Hitachi.

Optimized detector switching enhances measurement accuracy

Example of measured data around the detector switching wavelength
(Absorption spectrum of gold nanorods)

Multiple detectors are installed in the integrating sphere to perform measurements over a wide range of wavelengths, from ultraviolet to visible to near infrared regions. The changes in photometric values at detector switching (from signal level differences) are minimized due to a new design utilizing Hitachi’s expertise in integrating sphere construction and signal processing technologies.

Low stray light and low polarization characteristics attained through Hitachi’s high-performance prism-grating double monochromator system

The UH4150 adopts a prism-grating (P-G) double monochromator optical system, inherited from the highly evaluated U-4100. Large changes in light intensity of the S and P polarization are minimized with a (P-G) configuration. The UH4150 can perform low noise measurements, even with low transmittance and reflectance samples.

Collimated beam for accurate measurement of reflected and scattered light

Example of specular reflectance measurement

The incident angle is important for the measurement of specular reflectance of solid samples. For a focused light beam, the incident angle varies depending on the factors such as the lens’s focal length. Consequently, the values of simulation of design of optical thin films, such as dielectric multilayer film and prism, would differ from actual measured values. With a collimated beam, however, the incident angle is always the same with respect to the sample, leading to a highly accurate measurement of specular reflectance. Furthermore, the collimated light beam is useful for the evaluation of diffusivity (haze) and the measurement of transmittance of lenses.

A wide variety of detectors to meet a broad range of measurements and applications

Eight types of integrating spheres of different materials, sizes, and shapes are available.

Detector lineup

New ergonomic design

The sample compartment door utilizes an ergonomic design for improved sample exchange.

Compatible accessories

Many removable accessories for the U-4100 can also be used with Model UH4150.

Improved throughput

While inheriting the high-performing optical system of the model U-4100, the UH4150 provides higher throughput measurements. In the previous model, a scan speed of 600 mm/min was necessary for a measurement using a data interval of 1 nm. With Model UH4150, you can measure at 1-nm intervals while using a scan speed of 1,200 nm/min, reducing the measurement time significantly. The UH4150 measures from 240 to 2,600 nm in approximately two minutes. It is effective for samples requiring measurement in UV-VIS-NIR wavelength range, such as solar reflective materials.


Reflectance Spectrum of Solar Reflective Material using Scan Speed of 600 nm/min	Reflectance Spectrum of Solar Reflective material using Scan Speed of 1,200 nm/min

Specifications

	INTEGRATING SPHERE DETECTION SYSTEM		DIRECT LIGHT DETECTION SYSTEM
MONOCHROMATOR	Prism-Grating, Double monochromator, Pre-monochromator: Littrow monochromator using a prism, Main monochromator: Czerny-Turner monochromator using Diffraction grating (2 switchable diffraction gratings)
SETTING WAVELENGTH RANGE	175 to 3,300 nm
MEASURABLE Wavelength range	260 to 2,600 nm	190 to 2,600 nm	185 to 3,300 nm
Bandpass (UV-VIS)	Less than ± 0.002 Abs (240 - 850 nm, slit width; 4 nm, scan speed; 300 nm/min	Less than ± 2.0%T (190 - 195 nm, slit width; 5 nm, scan speed; 300 nm/min) Less than ± 0.5%T (195 - 850 nm, slit width; 5 nm, scan speed; 300 nm/min)	Less than ± 0.05 Abs (185 - 200 nm, slit width; 2 nm, scan speed; 300 nm/min) Less than ± 0.001 Abs (200 - 850 nm, slit width; 2 nm, scan speed; 300 nm/min)
BANDPASS (NIR)	Less than ± 0.002 Abs (850 - 2,200 nm, automatic slit width, scan speed; 750 nm/min, PbS sensitivity; 1) Less than ± 0.004 Abs (2,200 to 2,600 nm, automatic slit width, scan speed: 750 nm/min, PbS sensitivity: 1)	Less than ± 0.5%T (850 - 2,600 nm, automatic slit width, scan speed: 750 nm/min, PbS sensitivity: 1)	Less than ± 0.002 Abs (850 - 2,500 nm, automatic slit width, scan speed: 750 nm/min, PbS sensitivity: 1) Less than ± 0.004 Abs (2,500 to 3,300 nm, automatic slit width, scan speed: 750 nm/min, PbS sensitivity: 1)
Scan speed	Visible region: 0.3, 3, 15, 30, 60, 120, 300, 600, 1,200, and 2,400; Near infrared region: 0.75, 7.5, 37.5, 75, 150, 300, 750, 1,200, 1,500, 3,000, and 6,000 Go to λ: 3,600 nm/min (9,000 nm/min for near infrared region)
Detector	Standard Integrating Sphere (inner coating: BaSO4) 60 mm Standard Integrating Sphere (4-port type) : Incident angle on reflective sample: Sample side: 8°, reference side: 0° 60 mm Standard Integrating Sphere (4-port type) : Incident angle on reflective sample: Sample side and reference side;10° 60 mm Standard Full Integrating Sphere (2-port type)	High-sensitivity integrating sphere (inner coating: Spectralon®) Direct light detector 60 mm High-sensitivity Integrating Sphere (4-port type) :Incident angle on reflective sample: Sample side: 8°, reference side: 0° 60 mm High-sensitivity Full Integrating Sphere (2-port type)	Direct light detector
Dimensions	900 (W) x 760 (D) x 1,180 (H) mm
Weight	Approx. 160 Kg

Options

System Configurations

	Integrating Sphere Detection System A variety of 60 mm integrating spheres are available. As optional items, we offer 150 mm integrating spheres or Continuously Variable Angle Absolute Reflectance accessories (60 mm standard integrating sphere is shown here).
	Direct Light Detection System The direct light detector is built in the spectrophotometer. The direct light detector can be replaced with other optional detectors, such as various Integrating Spheres and Continuously Variable Angle Absolute Reflectance accessories.